Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection

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Predicting Error Rate for Microprocessor-Based Digital Architectures through C.E.U. (Code Emulating Upsets) Injection

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ژورنال

عنوان ژورنال: IEEE Transactions on Nuclear Science

سال: 2000

ISSN: 0018-9499,1558-1578

DOI: 10.1109/23.903784